iC-BR corporate profile updated
March 19th, 2012
As of today, an updated corporate profile on iC-BR is available on the Downloads area of the website, along with various articles and technical documents regarding our product line.
After briefly introducing both iC-BR and iC-Haus, the presentation covers our entire line of integrated circuits, with extra application examples. Additionally, the section on ASIC design has been extended to include iC-LNB, an optical encoder developed in partnership by the two companies, to be released in H1 2012.
Download our corporate profile in the Downloads areaMarch 5th, 2012
iC-Haus just released a new product for its sensors portfolio: iC-LO, an optical sensor specific for triangulation systems.
Developed for applications which implement the optical triangulation technique for object detection, iC-LO contains inside the chip 129 optical sensors specially displaced for triangulation, with adaptative analog amplification, filtering and digital signals processing, which execute all triangulation processing with high performance. The main features of iC-LO are:
- Ambient light suppression (up to 100 kLux)
- Integrated emitter LED driver
- Parameters configuration (object distance, hysteresis, LED intensity, etc) via SPI interface
The iC-LO provides a digital output generated by the calculated triangulation, indicating presence or absence of an object within the configured range. Therefore, a complete triangulation system can be assembled using only the iC-LO, a LED and a simple microcontroller to program the sensor.
More information about iC-LONew Article: "Functional Safety" in automotive applications
February 9th, 2012
A new article about "Functional Safety" in automotive applications is available in our Downloads area.
The article discusses the impacts that the increasing adoption of IEC 61508 and ISO 26262 has on the development of automotive electronic systems. With the concept of "Functional Safety" in the foreground, it presents a general view of microcontroller-based automotive platforms, specifically exploring the fail-safe driving of power FETs. It then shows the necessity of performing an FMEA study in all levels of the system, starting from the design of the integrated circuit (in this case, the FET driver).
Click here to download the article (PDF in Portuguese)Click here to go to our Downloads section
